[fluka-discuss]: FLUKA Simulation with X_REFLEC Card

From: Tavakkoly, Marziyeh Sadat <marziyeh.tavakkoly_at_xfel.eu>
Date: Wed, 12 Jun 2024 10:52:33 +0200 (CEST)

Dear FLUKA experts,

I have a B4C-coated silicon mirror (we can consider just B4C) and 1 keV X-rays as the source. At an incident grazing angle of 9 mrad, 96% of the rays are reflected, and only 4% are absorbed. I want to calculate the penetration depth.

Since the penetration depth (attenuation length) should not differ much at grazing angles of 9 and 19 mrad, I observed in FLUKA that it is 25 nm for 9 mrad and 51 nm for 19 mrad, without considering any "X_REFLEC" card.

Now, with the new feature (X_REFLEC), I want to simulate again and find the penetration depth. Could you please help me use it correctly? With the definition below, it does not work:


Thank you and best regards,
Marziyeh


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Received on Wed Jun 12 2024 - 12:31:46 CEST

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