Date: Mon, 7 Oct 2024 10:41:26 +0200 (CEST)
Dear Fluka Expert,
I am simulating a silicon mirror and investigating the penetration depth of an X-ray beam (10 keV) into the material. By penetration depth, I refer to the distance at which the X-ray beam intensity decreases to 1/e of the incident beam intensity (Zpen).
When plotting the "1D projection Z," the penetration depth (exp(-z/Zpen)) appears similar in both cases (with and without reflectivity) using the "X-REFLEC" option, regardless of whether I apply the 'Energy' or 'Beampart' cards.
However, in the "2D projection (Y vs Z)" plots, it seems that the photons penetrate deeper into the material in the case without reflectivity.
So the beam penetrating the disks both with and without reflection have an identical distribution through the disk and experimentally it should be different.
I have attached the relevant images and input file for your reference.
Any suggestions or insights you could provide would be greatly appreciated.
Best regards,
Marziyeh
__________________________________________________________________________
You can manage unsubscription from this mailing list at https://www.fluka.org/fluka.php?id=acc_info
(image/png attachment: Energy_Silicon_10keV.png)
- application/octet-stream attachment: Silicon_10keV_grazing.inp
(image/png attachment: Beampart_Silicon_10keV.png)