Hello Aman,
you could use DETECT to score the full energy spectrum and
USRYIELD to score the energy and the angle of the scattered photons.
With USRYIELD Fluka can calculate a double differential plain yield
and you can have different bins in the first variable (usually energy),
but only one bin in the second (usually angle). To explore different
angles you can add other USRYIELD cards, one for each angular bin.
Please refer to the manual.
I attach a simple example with a thin silicon target in which I use
both techniques: starting from this you can hopefully test the different
options.
Kind regards,
Andrea
PS
Make sure to adapt the EMF-CUT thresholds to your problem
(I have used low values in the example to record also the multiple
Compton scattering events in the spectrum).
On 08/07/2019 06:04, Aman Sharma wrote:
> Dear Fluka experts,
>
> I am trying to simulate a interaction of photons with some material.
> How I could record the Compton scattered photons alongwith spectrum at
> different angles ? What cards are necessary as regards the input and
> scoring of scattered photons ? Any example/link for the same will be
> helpful.
>
> Thanks in advance !
> Aman
--
========================================================================
Dr. Andrea Fontana tel: +39 0382 987991
Istituto Nazionale fax: +39 0382 423241
di Fisica Nucleare
Sezione di Pavia e-mail: andrea.fontana_at_pv.infn.it
Via Bassi 6 web : www.pv.infn.it/~fontana
27100 PAVIA, Italy
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Received on Mon Jul 08 2019 - 16:06:50 CEST