Last version:
FLUKA 2023.3.4, April 10th 2024
(last respin 2023.3.4)
flair-2.3-0d 13-Sep-2023

News:

-- Fluka Release
( 10.04.2024 )

FLUKA 2023.3.4 has been released.


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EMFFLUO

Activates a detailed treatment of photoelectric interactions and of the following atomic deexcitation, with production of fluorescence X-rays (and a rough treatment of Auger electrons)

See also EMF

This option, meaningful only if the EMF option has been requested (explicitly or implicitly via option DEFAULTS), requires a special unformatted file, pre-connected as logical input unit 13 (see Chap. (3)). This file is delivered with the FLUKA code.

     WHAT(1) >= 0: set fluorescence on
             < 0 : set fluorescence off
             = 0 : ignored
             Default = -1.0 (no fluorescence) if option DEFAULTS is not used, or
                       if it is used with anything but CALORIMEtry, EM-CASCAde,
                       ICARUS or PRECISIOn.
                       If DEFAULTS is used with a SDUM value equal to one of the
                       latter, the default is 1.0 (fluorescence on).

     WHAT(2) = lower bound (or corresponding name) of the material indices in
               which fluorescence is activated
               ("From material WHAT(2)...")
             Default = 3.

     WHAT(3) = upper bound (or corresponding name) of the material indices in
               which fluorescence is activated
               ("... to material WHAT(3)...")
             Default  = WHAT(2)

     WHAT(4) = step length in assigning indices
               ("...in steps of WHAT(4)")
             Default = 1.

     WHAT(5), WHAT(6), SDUM : not used

     Default (option EMFFLUO not requested): fluorescence is not simulated
             unless option DEFAULTS is chosen with SDUM = CALORIMEtry,
             EM-CASCAde, ICARUS or PRECISIOn.

Notes:

  • 1) Selection of EMFFLUO option is only meaningful for a material defined with electron and photon cutoffs lower than the highest K-edge in the elements constituents of that material.

  • 2) When EMFFLUO is activated for a compound material, if the incident photon energy is lower than the highest K-edge for any constituent element, FLUKA uses separate parameterised representations of the photoelectric cross section between different edges of each constituent element (all levels having a binding energy > 1 keV are tabulated). If the photon energy is higher than the highest K-edge, average cross sections for the compound are used, but FLUKA still samples a single element on which to interact, in order to generate the correct fluorescence photon or Auger electron.

Example (number-based):

 *...+....1....+....2....+....3....+....4....+....5....+....6....+....7....+....8
 EMF
 EMFCUT         1.E-5     1.E-5       0.0       17.       18.
 EMFFLUO          1.0       17.       18.
 *   In the above example, the user activates fluorescence production in
 *   Lead and Tantalum (standard FLUKA material numbers 17 and 18). The
 *   photon and electron cutoff has been set at 10 keV (the K-edge for
 *   Pb and Ta is of the order of 100 keV).

The same example, name-based:

 EMF
 EMFCUT         1.E-5     1.E-5       0.0      LEAD  TANTALUM
 EMFFLUO          1.0      LEAD  TANTALUM

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