Dear Fluka developer and users
I want to calculate damage in silicon device and I knew that
with define SI1MEVNE in the fluence estimator like USRTRACK, we can
calculate fluence of "1-MeV n equivalent particle" but i think we must do
some procedure:
d*E*de/d*x*=integral of(*E*dis d*S) *= *N*A Integral of (*D(E)F(E) *d*E )**
** *[MeV cm-1]*.*
*(For getting NIEL)*
*Now my questions are:*
*1) My concept and solution is right or wrong?*
*2) If it is right, for calculation of above formula, it needs damage
function that I saw it in fluka out file as a library.*
*can I use them as damage function? And what's its unit?*
*3) Is it useful for cascade damage or just point defect( both of SI1MEVNE
and NIEL formula)?*
*Regards*
*Mojdeh Anjom***
Received on Fri Jun 04 2010 - 00:24:16 CEST
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