Re: Single Event Effect

From: Markus Brugger <>
Date: Tue, 6 Nov 2012 08:46:50 +0100


Using FLUKA to calculate quantities related to radiation damage to electronics is fairly straight forward. As you’re possibly
interested in ‘Single Event Effects’ you can directly score
- HADGT20M: High-energy hadrons (hadrons >20MeV [cm-2])
- HEHAD‐EQ: or a high-energy hadron ‘equivalent’: as above, but taking also account intermediate energy neutrons through a Weibull
like fit

For cumulative effects you’ve:
- DOSE: total dose [GeV/g]
- SI1MEVNE: 1MeV neutron equivalent

For details, please refer to the special scorings lecture:

One side note concerning the problem with the power supply (powerMOS failure?, any details about the applied derating) you have: SEE
as cause for the damage sounds indeed possible. As there are RadMons (from CERN) now available at JLAB, you might want to check if
measurements were performed nearby (contact Vashek Vylet or Pavel Degtiarenko).

Hope this helps, cheers


-----Original Message-----
From: [] On Behalf Of Maruyama, Takashi
Sent: 01 November 2012 19:01
Subject: Single Event Effect

   We had two power supply failures during one-month run at Jlab. The beam was brems photons with an intensity of 10^7/sec generated
by 5.5 GeV 100 nA e- beam.
The DAQ system was sitting about 1 m from the beam line. The FPGA never failed, but the power supply died and we suspected a power
transistor failure.
We are trying to understand what caused these failures because we want to operate the FPGA in vacuum only 10 cm from the beam in the
If it were Single Event Effect, I would think fast hadrons (mostly neutrons) were generated in the collimator at the e- sweeping
magnet, and neutron + Si interactions produced Si-ions, which killed the power transistor.
Does anyone have any experience in using FLUKA to simulate SEE? Thank you.

    Takashi Maruyama
Received on Tue Nov 06 2012 - 09:28:57 CET

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