Hi, everyone£¡
I calculate the secondary electron yield (SEY) by FLUKA, but the simulation results show a great difference with the experimental results. For 18 MeV proton incident on 0.79-mm thick gold target, the experimental SEY is 0.26 (PAPER: THE SECONDARY-ELECTRON YIELD MEASURED FOR 5-24 MeV PROTONS ON ALUMINUM-OXIDE AND GOLD TARGETS), but the simulated SEY is only 0.0356.
The scoring card I used is USRBDX which counts the electron emitted from the target surface to the ambient. We change the defaults as follows: a) set with the DEFAULTS card the PRECISIOn default, b) set with the DELTARAY card the threshold for delta ray production down to 1 keV (the minimum FLUKA can do) for all materials, c) set with the EMFCUT card (sdum PROD-CUT and transport) the production and transport threshold for electrons and photons down to 1 keV. The PHYSICS cards added are COALESCE and EVAPORAT. And I think the STEPSIZE is also set to be small enough.
Attachment is the FLUKA input file and the experimental values, does anyone know which should be added to the input file to obtain the correct results?
Regards,
T. Yang
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Received on Tue Sep 01 2015 - 16:38:12 CEST