Dear Yang Tao,
the experimental set up described in the mentioned paper cannot be
simulated with fluka. The experiment was collecting electrons down to
zero energy, and "produced within 100 angstrom from the surface". These
conditions exceed the range of application of FLUKA.
Regards
Paola
> Hi, everyone£¡
> I calculate the secondary electron yield (SEY) by FLUKA, but the
> simulation results show a great difference with the experimental
> results. For 18 MeV proton incident on 0.79-mm thick gold target, the
> experimental SEY is 0.26 (PAPER: THE SECONDARY-ELECTRON YIELD MEASURED
> FOR 5-24 MeV PROTONS ON ALUMINUM-OXIDE AND GOLD TARGETS), but the
> simulated SEY is only 0.0356.
> The scoring card I used is USRBDX which counts the electron emitted
> from the target surface to the ambient. We change the defaults as
> follows: a) set with the DEFAULTS card the PRECISIOn default, b) set
> with the DELTARAY card the threshold for delta ray production down to
> 1 keV (the minimum FLUKA can do) for all materials, c) set with the
> EMFCUT card (sdum PROD-CUT and transport) the production and transport
> threshold for electrons and photons down to 1 keV. The PHYSICS cards
> added are COALESCE and EVAPORAT. And I think the STEPSIZE is also set
> to be small enough.
>
> Attachment is the FLUKA input file and the experimental values, does
> anyone know which should be added to the input file to obtain the
> correct results?
>
>
> Regards,
> T. Yang
>
>
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>
>
>
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>
Paola Sala
INFN Milano
tel. Milano +39-0250317374
tel. CERN +41-227679148
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Received on Mon Sep 07 2015 - 15:15:12 CEST