Dear experts,
I want to get E-, T- distributions (and large statistics - as the 1-st
step) at the large distance from the target.
I have checked the BIASING option for this task. - simple detector
example.
Lead target in the polyethilen , P beam with E= 2 GeV.
On the right and on the left of the target there are 2 virtual
counters (box of air) : C2 and C22.
C2 is disposed at the interior of 3 air-boxes with BIAS-coefficients:
10-100-1000
C22 - on the left has no BIAS option : direct filling for particles
to compare results with C2.
I saved also input particles at C2 and C22
(initial lines are presented)
Results are in zip-file : result.zip.
My questions :
1) for C2 with BIASING I have got large multiplication of secondary
particles - BUT they have the same parameters !
As a result, E-distributions for C2 and C22 (no BIAS) are the same.
So, BIASING here can improve only integral values , for example :
particle density in the given volume
But, distributions are the same .. - am I right ?
2) Are there any methods (ideas ?) how to change parameters of the
generated
particles for C2 : E-values, angles,... to enlarge statistics
as the 1-st step for the following 2-nd step of simulation ?
... or I have to to use only direct C2 filling (no BIAS)
Thank you,
Vladimir
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Received on Fri Mar 13 2020 - 09:27:10 CET